Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW: International On-Line Testing Workshop, Jul 2000, Palma de Mallorca
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Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Comparison between Random and Pseudo-Random…