A comparative study of epitaxial InGaAsBi/InP structures using Rutherford backscattering spectrometry, X-ray diffraction and photoluminescence techniques
This research output has an Altmetric Attention Score of 4. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 02 October 2019.
All research outputs
#7,966,106
of 24,230,934 outputs
Outputs from Journal of Applied Physics
#3,694
of 21,319 outputs
Outputs of similar age
#136,169
of 349,849 outputs
Outputs of similar age from Journal of Applied Physics
#16
of 139 outputs
Altmetric has tracked 24,230,934 research outputs across all sources so far. This one has received more attention than most of these and is in the 66th percentile.
So far Altmetric has tracked 21,319 research outputs from this source. They receive a mean Attention Score of 3.6. This one has done well, scoring higher than 82% of its peers.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 349,849 tracked outputs that were published within six weeks on either side of this one in any source. This one has gotten more attention than average, scoring higher than 60% of its contemporaries.
We're also able to compare this research output to 139 others from the same source and published within six weeks on either side of this one. This one has done well, scoring higher than 87% of its contemporaries.
