Delay fault testing: choosing between random SIC and random MIC test sequences

Overview of attention for article published in 10th IEEE European Test Symposium (ETS'05), January 2000

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (92nd percentile)
High Attention Score compared to outputs of the same age and source (87th percentile)

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Arnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch.

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