Electrooptic sensor for near-field measurement

Overview of attention for article published in IEEE Transactions on Instrumentation and Measurement, April 1999

Altmetric Badge

Mentioned by

patent: 2 patents

Readers on

mendeley: 22 Mendeley

So far, Altmetric has seen 2 patents that reference this research output.

Method and apparatus for simultaneous measurement of electric field and temperature using…

Grant US-6906506-B1

United States of America

Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping…

Grant US-6677769-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.