Interference model for back-focal-plane displacement detection in optical tweezers.

Overview of attention for article published in Optics Letters, January 1998

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So far, Altmetric has seen 11 patents that reference this research output.

Label-free microscopy

Application DE-112018005412-T5

Germany

02 Jul 2020

LABEL-FREE MICROSCOPY

Application WO-2019093895-A1

World Intellectual Property Organisation (WIPO)

16 May 2019

Method and apparatus for measuring the optical forces acting on a particle

Grant US-8637803-B2

United States of America

28 Jan 2014

Holographic microfabrication and characterization system for soft matter and biological…

Grant US-8431884-B2

United States of America

30 Apr 2013

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