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A Contact-Resistive Random-Access-Memory-Based True Random Number Generator

Overview of attention for article published in IEEE Electron Device Letters, June 2012
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • Among the highest-scoring outputs from this source (#14 of 4,265)
  • High Attention Score compared to outputs of the same age (96th percentile)
  • High Attention Score compared to outputs of the same age and source (97th percentile)

Mentioned by

news
1 news outlet
twitter
1 X user
patent
13 patents

Readers on

mendeley
58 Mendeley
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Article details
Title
A Contact-Resistive Random-Access-Memory-Based True Random Number Generator
Published in
IEEE Electron Device Letters, June 2012
DOI 10.1109/led.2012.2199734
Authors

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Timeline Attention over time Attention Score history
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X Demographics

X Demographics

The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Mendeley demographics

Mendeley demographics

The data shown below were compiled from readership statistics for 58 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Geographical breakdown
Country Count As %
Japan 1 2%
Israel 1 2%
United Kingdom 1 2%
France 1 2%
Unknown 54 93%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Student > Ph. D. Student 13 22%
Student > Master 8 14%
Researcher 7 12%
Student > Bachelor 5 9%
Professor 2 3%
Other 4 7%
Unknown 19 33%
Readers by discipline
Readers by discipline Count As %
Engineering 27 47%
Computer Science 4 7%
Physics and Astronomy 4 7%
Materials Science 3 5%
Business, Management and Accounting 1 2%
Other 1 2%
Unknown 18 31%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 31. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 17 June 2025.
All research outputs
#1,514,514
of 30,143,106 outputs
Outputs from IEEE Electron Device Letters
#14
of 4,265 outputs
Outputs of similar age
#7,234
of 187,949 outputs
Outputs of similar age from IEEE Electron Device Letters
#1
of 34 outputs
Altmetric has tracked 30,143,106 research outputs across all sources so far. Compared to these this one has done particularly well and is in the 94th percentile: it's in the top 10% of all research outputs ever tracked by Altmetric.
So far Altmetric has tracked 4,265 research outputs from this source. They receive a mean Attention Score of 4.3. This one has done particularly well, scoring higher than 99% of its peers.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 187,949 tracked outputs that were published within six weeks on either side of this one in any source. This one has done particularly well, scoring higher than 96% of its contemporaries.
We're also able to compare this research output to 34 others from the same source and published within six weeks on either side of this one. This one has done particularly well, scoring higher than 97% of its contemporaries.