A Contact-Resistive Random-Access-Memory-Based True Random Number Generator
Overview of attention for article published in IEEE Electron Device Letters, June 2012
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In the top 25% of all research outputs scored by Altmetric
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Among the highest-scoring outputs from this source (#14 of 4,265)
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High Attention Score compared to outputs of the same age (96th percentile)
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High Attention Score compared to outputs of the same age and source (97th percentile)
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