↓ Skip to main content

Detecting Incipient Faults in Software Systems: A Compressed Sampling-Based Approach

Overview of attention for article published in this source, June 2016
Altmetric Badge

Mentioned by

patent
1 patent

Readers on

mendeley
5 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Article details
Title
Detecting Incipient Faults in Software Systems: A Compressed Sampling-Based Approach
Published by
Institute of Electrical and Electronics Engineers (IEEE), June 2016
DOI 10.1109/cloud.2016.0048
Authors

Login to access the Attention Digest and the Sentiment Analysis related to this output.

Timeline Attention over time Attention Score history
Login to access the full charts related to this output.
Activity
Login to access the full charts related to this output.
Mendeley demographics

Mendeley demographics

The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Login to view Mendeley reader trends over time.

Geographical breakdown

Geographical breakdown
Country Count As %
Unknown 5 100%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Student > Master 2 40%
Student > Ph. D. Student 1 20%
Unknown 2 40%
Readers by discipline
Readers by discipline Count As %
Computer Science 2 40%
Engineering 1 20%
Unknown 2 40%