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Mendeley readers
Title |
Defect Inspection Techniques in SiC
|
---|---|
Published in |
Discover Nano, March 2022
|
DOI | 10.1186/s11671-022-03672-w |
Pubmed ID | |
Authors |
Po-Chih Chen, Wen-Chien Miao, Tanveer Ahmed, Yi-Yu Pan, Chun-Liang Lin, Shih-Chen Chen, Hao-Chung Kuo, Bing-Yue Tsui, Der-Hsien Lien |
Mendeley readers
The data shown below were compiled from readership statistics for 74 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 74 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 16 | 22% |
Researcher | 13 | 18% |
Student > Master | 4 | 5% |
Other | 2 | 3% |
Student > Doctoral Student | 2 | 3% |
Other | 4 | 5% |
Unknown | 33 | 45% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 16 | 22% |
Engineering | 7 | 9% |
Physics and Astronomy | 6 | 8% |
Chemistry | 3 | 4% |
Energy | 1 | 1% |
Other | 1 | 1% |
Unknown | 40 | 54% |