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Mendeley readers
| Chapter title |
Modeling Single Event Crosstalk Noise in Nanometer Technologies
|
|---|---|
| Chapter number | 5 |
| Book title |
Soft Error Mechanisms, Modeling and Mitigation
|
| Published by |
Springer, Cham, January 2016
|
| DOI | 10.1007/978-3-319-30607-0_5 |
| Book ISBNs |
978-3-31-930606-3, 978-3-31-930607-0
|
| Authors |
Selahattin Sayil |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 1 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 1 | 100% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 1 | 100% |