Automated defect inspection of LED chip using deep convolutional neural network

Overview of attention for article published in Journal of Intelligent Manufacturing, March 2018

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In the top 25% of all research outputs scored by Altmetric
One of the highest-scoring outputs from this source (#3 of 628)
High Attention Score compared to outputs of the same age (82nd percentile)
High Attention Score compared to outputs of the same age and source (99th percentile)

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patent: 6 patents

Citations

dimensions_citation: 182 Dimensions

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mendeley: 118 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 6 patents that reference this research output.

Inspection apparatus, control method, and program

Grant US-11906441-B2

United States of America

Method and device for detecting defects of lamp beads

Application CN-117058150-A

China

INSPECTION APPARATUS, CONTROL METHOD, AND PROGRAM

Application US-20220317055-A1

United States of America

METHOD, COMPUTER PROGRAM PRODUCT, AND DEVICE COMPRISING SUCH A PRODUCT FOR DISPLAYING THE…

Application WO-2022069702-A1

World Intellectual Property Organisation (WIPO)

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