In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices

Overview of attention for article published in Journal of the Korean Physical Society, January 2023

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In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices https://t.co/A8aI8B8rs5 STMで空気に触れずに層状物質の厚み依存性を調べる手法の提案か

26 Dec 2022

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[2212.12126] Hyoung Kug Kim, Dowook Kim, Dong Guk Lee et al.: In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices https://t.co/h70DrdsjbU https://t.co/7vx536BCcS #cond_mat_mtrl_sci

26 Dec 2022

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