In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface

Overview of attention for article published in Journal of Materials Science, January 2023

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RT @NanoscienceInst: Hot off the press!🔥Using the @DENSsolutions Lightning, amorphous oxide layer interface evolution was studied under in…

30 Jan 2023

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Hot off the press!🔥Using the @DENSsolutions Lightning, amorphous oxide layer interface evolution was studied under in situ heating & biasing with AC-STEM, providing fundamental insight into metal-cermic microelectronic properties. 📰 Read the full pape

27 Jan 2023

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RT @TUDarmstadt: #research #researchTUDa

27 Jan 2023

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#research #researchTUDa

27 Jan 2023

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