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Alignment of the CMS silicon tracker during commissioning with cosmic rays

Overview of attention for article published in Journal of Instrumentation, March 2010
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • High Attention Score compared to outputs of the same age (89th percentile)
  • High Attention Score compared to outputs of the same age and source (99th percentile)

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