Preconditioning of p-GaN power HEMT for reproducible V th measurements

Overview of attention for article published in Microelectronics Reliability, May 2023

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Our latest work available free access till May 16, 2023 https://t.co/6L2BvwKQ90 "Preconditioning of p-GaN power HEMT for reproducible Vth measurements" Congrats Lucien Ghizzo for your first paper !

13 Apr 2023

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