3D to 2D perspectives - Traditional and new doping and metrology challenges at the nanoscale

Overview of attention for article published in Materials Science in Semiconductor Processing, August 2023

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Above-average Attention Score compared to outputs of the same age (60th percentile)
Good Attention Score compared to outputs of the same age and source (77th percentile)

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twitter: 3 X users

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Summary X Dimensions citations

So far, Altmetric has seen 3 X posts from 3 X users, with an upper bound of 1,708 followers.

RT @MTU_PhysSci: Hot off the press! 3D to 2D perspectives - Traditional and new doping and metrology challenges at the nanoscale https://t.…

29 May 2023

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RT @MTU_PhysSci: Hot off the press! 3D to 2D perspectives - Traditional and new doping and metrology challenges at the nanoscale https://t.…

26 May 2023

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Hot off the press! 3D to 2D perspectives - Traditional and new doping and metrology challenges at the nanoscale https://t.co/0O872WTVDk Well done Margarita, Nikolay and Ray @TyndallInstitut @cappa_ie

26 May 2023

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