↓ Skip to main content

X-Rel: Energy-Efficient and Low-Overhead Approximate Reliability Framework for Error-Tolerant Applications Deployed in Critical Systems

Overview of attention for article published in IEEE Transactions on Very Large Scale Integration (VLSI) Systems, May 2023
Altmetric Badge

Mentioned by

twitter
1 X user

Readers on

mendeley
12 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
X-Rel: Energy-Efficient and Low-Overhead Approximate Reliability Framework for Error-Tolerant Applications Deployed in Critical Systems
Published in
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, May 2023
DOI 10.1109/tvlsi.2023.3272226
Authors

Jafar Vafaei, Omid Akbari, Muhammad Shafique, Christian Hochberger

Timeline

Login to access the full chart related to this output.

If you don’t have an account, click here to discover Explorer

X Demographics

X Demographics

The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
As of 1 July 2024, you may notice a temporary increase in the numbers of X profiles with Unknown location. Click here to learn more.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 12 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 12 100%

Demographic breakdown

Readers by professional status Count As %
Unspecified 1 8%
Student > Ph. D. Student 1 8%
Student > Bachelor 1 8%
Researcher 1 8%
Unknown 8 67%
Readers by discipline Count As %
Engineering 2 17%
Business, Management and Accounting 1 8%
Unspecified 1 8%
Unknown 8 67%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 1. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 20 June 2023.
All research outputs
#23,496,720
of 26,174,669 outputs
Outputs from IEEE Transactions on Very Large Scale Integration (VLSI) Systems
#1,415
of 1,437 outputs
Outputs of similar age
#344,308
of 401,083 outputs
Outputs of similar age from IEEE Transactions on Very Large Scale Integration (VLSI) Systems
#1
of 1 outputs
Altmetric has tracked 26,174,669 research outputs across all sources so far. This one is in the 1st percentile – i.e., 1% of other outputs scored the same or lower than it.
So far Altmetric has tracked 1,437 research outputs from this source. They receive a mean Attention Score of 3.8. This one is in the 1st percentile – i.e., 1% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 401,083 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 1st percentile – i.e., 1% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 1 others from the same source and published within six weeks on either side of this one. This one has scored higher than all of them