A silicon carbide room-temperature single-photon source

Overview of attention for article published in Nature Materials, November 2013

Altmetric Badge

About this Attention Score

In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (86th percentile)
Average Attention Score compared to outputs of the same age and source

Mentioned by

twitter: 4 X users
patent: 1 patent

wikipedia: 2 Wikipedia pages

Citations

dimensions_citation: 458 Dimensions

Readers on

mendeley: 456 Mendeley
citeulike: 1 CiteULike

Summary X Patents Wikipedia Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

PROCESS AND DEVICE FOR THE SPATIALLY RESOLVED LOCALIZATION OF DEFECTS IN MATERIALS

Application WO-2023280758-A1

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.