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Testing of Interposer-Based 2.5D Integrated Circuits

Overview of attention for book
Attention for Chapter 5: Built-In Self-Test
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4 Mendeley
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Chapter title
Built-In Self-Test
Chapter number 5
Book title
Testing of Interposer-Based 2.5D Integrated Circuits
Published by
Springer, Cham, January 2017
DOI 10.1007/978-3-319-54714-5_5
Book ISBNs
978-3-31-954713-8, 978-3-31-954714-5
Authors

Ran Wang, Krishnendu Chakrabarty

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 4 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 1 25%
Student > Doctoral Student 1 25%
Student > Master 1 25%
Unknown 1 25%
Readers by discipline Count As %
Computer Science 1 25%
Engineering 1 25%
Unknown 2 50%