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Testing of Interposer-Based 2.5D Integrated Circuits

Overview of attention for book
Attention for Chapter 7: A Programmable Method for Low-Power Scan Shift in SoC Dies
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Chapter title
A Programmable Method for Low-Power Scan Shift in SoC Dies
Chapter number 7
Book title
Testing of Interposer-Based 2.5D Integrated Circuits
Published by
Springer, Cham, January 2017
DOI 10.1007/978-3-319-54714-5_7
Book ISBNs
978-3-31-954713-8, 978-3-31-954714-5
Authors

Ran Wang, Krishnendu Chakrabarty

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Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 1 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 1 100%
Readers by discipline Count As %
Engineering 1 100%