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Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography

Overview of attention for article published in Plant Methods, November 2017
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • Good Attention Score compared to outputs of the same age (72nd percentile)
  • High Attention Score compared to outputs of the same age and source (82nd percentile)

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