You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Atomic force microscope base nanolithography for reproducible micro and nanofabrication
2014 IEEE International Conference on Semiconductor Electronics (ICSE2014), August 2014
Dehzangi, Arash, Larki, Farhad, Majlis, Burhanuddin Y., Kazemi, Zainab, Ariannejad, MohammadMahdi, Abdullah, A Makarimi, Nasery, Mahmood Goodarz, Navasery, Manizheh, Saion, Elias B, Halimah, Mohamed K, Khalilzadeh, Nasrin, Hutagalung, Sabar D., Arash Dehzangi, Farhad Larki, Burhanuddin Y. Majlis, Zainab Kazemi, MohammadMahdi Ariannejad, A Makarimi Abdullah, Mahmood Goodarz Nasery, Manizheh Navasery, Elias B Saion, Mohamed K Halimah, Nasrin Khalilzadeh, Sabar D. Hutagalung
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Bachelor||1||20%|
|Readers by discipline||Count||As %|