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Atomic Force Microscope base Nanolithography for Reproducible Micro and Nanofabrication

Overview of attention for article published in this source, August 2014
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Title
Atomic Force Microscope base Nanolithography for Reproducible Micro and Nanofabrication
Published by
Institute of Electrical and Electronics Engineers (IEEE), August 2014
DOI 10.1109/smelec.2014.6920884
Authors

Arash Dehzangi, Farhad Larki, Mahmood Goodarz Nasery, Manizheh Navasery, Burhanuddin Y. Majlis, Zainab Kazemi, Elias B Saion, Mohamed. K Halimah, Nasrin Khalilzadeh, A Makarimi Abdullah, Sabar D. Hutagalung, MohammadMahdi Ariannejad

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 5 100%

Demographic breakdown

Readers by professional status Count As %
Student > Bachelor 1 20%
Researcher 1 20%
Lecturer 1 20%
Unknown 2 40%
Readers by discipline Count As %
Engineering 3 60%
Unknown 2 40%