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Atomic force microscope base nanolithography for reproducible micro and nanofabrication

Overview of attention for article published in 2014 IEEE International Conference on Semiconductor Electronics (ICSE2014), August 2014
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Title
Atomic force microscope base nanolithography for reproducible micro and nanofabrication
Published in
2014 IEEE International Conference on Semiconductor Electronics (ICSE2014), August 2014
DOI 10.1109/smelec.2014.6920884
Authors

Dehzangi, Arash, Larki, Farhad, Majlis, Burhanuddin Y., Kazemi, Zainab, Ariannejad, MohammadMahdi, Abdullah, A Makarimi, Nasery, Mahmood Goodarz, Navasery, Manizheh, Saion, Elias B, Halimah, Mohamed K, Khalilzadeh, Nasrin, Hutagalung, Sabar D., Arash Dehzangi, Farhad Larki, Burhanuddin Y. Majlis, Zainab Kazemi, MohammadMahdi Ariannejad, A Makarimi Abdullah, Mahmood Goodarz Nasery, Manizheh Navasery, Elias B Saion, Mohamed K Halimah, Nasrin Khalilzadeh, Sabar D. Hutagalung

Mendeley readers

The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 5 100%

Demographic breakdown

Readers by professional status Count As %
Student > Bachelor 1 20%
Researcher 1 20%
Lecturer 1 20%
Unknown 2 40%
Readers by discipline Count As %
Engineering 3 60%
Unknown 2 40%