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Title |
Atomic force microscope base nanolithography for reproducible micro and nanofabrication
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Published in |
2014 IEEE International Conference on Semiconductor Electronics (ICSE2014), August 2014
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DOI | 10.1109/smelec.2014.6920884 |
Authors |
Dehzangi, Arash, Larki, Farhad, Majlis, Burhanuddin Y., Kazemi, Zainab, Ariannejad, MohammadMahdi, Abdullah, A Makarimi, Nasery, Mahmood Goodarz, Navasery, Manizheh, Saion, Elias B, Halimah, Mohamed K, Khalilzadeh, Nasrin, Hutagalung, Sabar D., Arash Dehzangi, Farhad Larki, Burhanuddin Y. Majlis, Zainab Kazemi, MohammadMahdi Ariannejad, A Makarimi Abdullah, Mahmood Goodarz Nasery, Manizheh Navasery, Elias B Saion, Mohamed K Halimah, Nasrin Khalilzadeh, Sabar D. Hutagalung |
Mendeley readers
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 5 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Bachelor | 1 | 20% |
Researcher | 1 | 20% |
Lecturer | 1 | 20% |
Unknown | 2 | 40% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 3 | 60% |
Unknown | 2 | 40% |