Title |
Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
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Published in |
Advanced Structural and Chemical Imaging, October 2017
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DOI | 10.1186/s40679-017-0047-0 |
Pubmed ID | |
Authors |
Jacob Madsen, Pei Liu, Jakob B. Wagner, Thomas W. Hansen, Jakob Schiøtz |
Abstract |
Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1-2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations. |
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Members of the public | 1 | 100% |
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Researcher | 6 | 13% |
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Other | 3 | 6% |
Unknown | 9 | 19% |