XRD Measurement of Mean Crystallite Thickness of Illite and Illite/Smectite: Reappraisal of the Kubler Index and the Scherrer Equation

Overview of attention for article published in Clays and Clay Minerals, June 1997

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Micro/nano devices fabricated from Cu-Hf thin films

Grant US-8458811-B2

United States of America

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