Bilateral texture filtering

Overview of attention for article published in ACM Transactions on Graphics, July 2014

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 173 Dimensions

Readers on

mendeley: 90 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

METHOD AND DEVICE FOR FILTERING TEXTURE, USING PATCH SHIFT

Application WO-2016114574-A3

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.