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Mendeley readers
Chapter title |
Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives
|
---|---|
Chapter number | 55 |
Book title |
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
|
Published by |
Springer, Berlin, Heidelberg, September 2005
|
DOI | 10.1007/11556930_55 |
Book ISBNs |
978-3-54-029013-1, 978-3-54-032080-7
|
Authors |
Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, Badereddine, Nabil, Girard, Patrick, Virazel, Arnaud, Pravossoudovitch, Serge, Landrault, Christian |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 1 | 33% |
Student > Doctoral Student | 1 | 33% |
Unknown | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 1 | 33% |
Engineering | 1 | 33% |
Unknown | 1 | 33% |