Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault. Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS: Power And Timing Modeling, Optimization and Simulati
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Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault.