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Inversion of V(z) Data in the Scanning Acoustic Microscope (SAM) to Determine Material Properties of a Layered Solid
Springer, Boston, MA, January 1992
Zuliang Yu, Siegfried Boseck
The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||3||50%|
|Readers by discipline||Count||As %|
|Physics and Astronomy||1||17%|