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Chapter title |
Nanoelectronic Coupled Problem Solutions: Uncertainty Quantification of RFIC Interference
|
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Chapter number | 42 |
Book title |
Progress in Industrial Mathematics at ECMI 2016
|
Published by |
Springer, Cham, June 2016
|
DOI | 10.1007/978-3-319-63082-3_42 |
Book ISBNs |
978-3-31-963081-6, 978-3-31-963082-3
|
Authors |
Piotr Putek, Rick Janssen, Jan Niehof, E. Jan W. ter Maten, Roland Pulch, Bratislav Tasić, Michael Günther, Putek, Piotr, Janssen, Rick, Niehof, Jan, Maten, E. Jan W. ter, Pulch, Roland, Tasić, Bratislav, Günther, Michael |