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Contactless VLSI Measurement and Testing Techniques

Overview of attention for book
Overall attention for this book and its chapters
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Mentioned by

wikipedia
1 Wikipedia page

Citations

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3 Dimensions

Readers on

mendeley
3 Mendeley
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Title
Contactless VLSI Measurement and Testing Techniques
Published by
Springer International Publishing, November 2017
DOI 10.1007/978-3-319-69673-7
ISBNs
978-3-31-969672-0, 978-3-31-969673-7
Authors

Sayil, Selahattin

Mendeley readers

The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 3 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 2 67%
Student > Postgraduate 1 33%
Readers by discipline Count As %
Engineering 2 67%
Physics and Astronomy 1 33%