↓ Skip to main content

Contactless VLSI Measurement and Testing Techniques

Overview of attention for book
Attention for Chapter 4: Contactless Testing
Altmetric Badge

Citations

dimensions_citation
3 Dimensions
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Contactless Testing
Chapter number 4
Book title
Contactless VLSI Measurement and Testing Techniques
Published by
Springer, Cham, January 2018
DOI 10.1007/978-3-319-69673-7_4
Book ISBNs
978-3-31-969672-0, 978-3-31-969673-7
Authors

Selahattin Sayil