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Scanning Microscopy for Nanotechnology

Overview of attention for book
Attention for Chapter 1: Fundamentals of Scanning Electron Microscopy (SEM)
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1 news outlet
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1 X user

Citations

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170 Dimensions

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3139 Mendeley
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Chapter title
Fundamentals of Scanning Electron Microscopy (SEM)
Chapter number 1
Book title
Scanning Microscopy for Nanotechnology
Published by
Springer, New York, NY, January 2006
DOI 10.1007/978-0-387-39620-0_1
Book ISBNs
978-0-387-33325-0, 978-0-387-39620-0
Authors

Weilie Zhou, Robert Apkarian, Zhong Lin Wang, David Joy, Zhou, Weilie, Apkarian, Robert, Wang, Zhong Lin, Joy, David

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X Demographics

The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 3,139 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Mexico 4 <1%
United States 3 <1%
United Kingdom 3 <1%
Chile 2 <1%
India 2 <1%
Malaysia 1 <1%
Ireland 1 <1%
Germany 1 <1%
Canada 1 <1%
Other 5 <1%
Unknown 3116 99%

Demographic breakdown

Readers by professional status Count As %
Student > Bachelor 528 17%
Student > Master 522 17%
Student > Ph. D. Student 438 14%
Researcher 142 5%
Student > Doctoral Student 116 4%
Other 239 8%
Unknown 1154 37%
Readers by discipline Count As %
Engineering 449 14%
Chemistry 378 12%
Materials Science 353 11%
Physics and Astronomy 154 5%
Chemical Engineering 123 4%
Other 416 13%
Unknown 1266 40%