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Scanning Microscopy for Nanotechnology

Overview of attention for book
Attention for Chapter 8: Applications of FIB and DualBeam for Nanofabrication
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Citations

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Chapter title
Applications of FIB and DualBeam for Nanofabrication
Chapter number 8
Book title
Scanning Microscopy for Nanotechnology
Published by
Springer, New York, NY, January 2006
DOI 10.1007/978-0-387-39620-0_8
Book ISBNs
978-0-387-33325-0, 978-0-387-39620-0
Authors

Brandon Van Leer, Lucille A. Giannuzzi, Paul Anzalone, Leer, Brandon Van, Giannuzzi, Lucille A., Anzalone, Paul, Van Leer, Brandon

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 8 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 8 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 4 50%
Other 2 25%
Student > Master 1 13%
Unknown 1 13%
Readers by discipline Count As %
Engineering 3 38%
Physics and Astronomy 3 38%
Agricultural and Biological Sciences 1 13%
Unknown 1 13%