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Mendeley readers
Title |
Hot Carrier Degradation in Semiconductor Devices
|
---|---|
Published by |
Springer International Publishing, October 2014
|
DOI | 10.1007/978-3-319-08994-2 |
ISBNs |
978-3-31-908993-5, 978-3-31-908994-2
|
Editors |
Grasser, Tibor |
Mendeley readers
The data shown below were compiled from readership statistics for 71 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Belgium | 1 | 1% |
Unknown | 70 | 99% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 26 | 37% |
Researcher | 11 | 15% |
Student > Master | 7 | 10% |
Student > Doctoral Student | 3 | 4% |
Student > Bachelor | 2 | 3% |
Other | 6 | 8% |
Unknown | 16 | 23% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 43 | 61% |
Physics and Astronomy | 4 | 6% |
Materials Science | 2 | 3% |
Social Sciences | 1 | 1% |
Agricultural and Biological Sciences | 1 | 1% |
Other | 1 | 1% |
Unknown | 19 | 27% |