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Hot Carrier Degradation in Semiconductor Devices
Springer International Publishing, October 2014
The data shown below were compiled from readership statistics for 48 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||21||44%|
|Student > Master||6||13%|
|Student > Doctoral Student||2||4%|
|Readers by discipline||Count||As %|
|Physics and Astronomy||2||4%|