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Hot-Carrier Degradation in Decananometer CMOS Nodes: From an Energy-Driven to a Unified Current Degradation Modeling by a Multiple-Carrier Degradation Process
Hot Carrier Degradation in Semiconductor Devices
Springer, Cham, January 2015
Alain Bravaix, Vincent Huard, Florian Cacho, Xavier Federspiel, David Roy
The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||2||33%|
|Student > Doctoral Student||2||33%|
|Readers by discipline||Count||As %|
|Immunology and Microbiology||1||17%|