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Mendeley readers
Chapter title |
Hot-Carrier Degradation in Decananometer CMOS Nodes: From an Energy-Driven to a Unified Current Degradation Modeling by a Multiple-Carrier Degradation Process
|
---|---|
Chapter number | 3 |
Book title |
Hot Carrier Degradation in Semiconductor Devices
|
Published by |
Springer, Cham, January 2015
|
DOI | 10.1007/978-3-319-08994-2_3 |
Book ISBNs |
978-3-31-908993-5, 978-3-31-908994-2
|
Authors |
Alain Bravaix, Vincent Huard, Florian Cacho, Xavier Federspiel, David Roy |
Mendeley readers
The data shown below were compiled from readership statistics for 8 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 8 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Doctoral Student | 3 | 38% |
Student > Ph. D. Student | 2 | 25% |
Other | 1 | 13% |
Professor | 1 | 13% |
Unknown | 1 | 13% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 4 | 50% |
Immunology and Microbiology | 1 | 13% |
Unknown | 3 | 38% |