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The Energy Driven Hot Carrier Model
Hot Carrier Degradation in Semiconductor Devices
Springer, Cham, January 2015
Stewart E. Rauch, Fernando Guarin
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Doctoral Student||1||33%|
|Student > Ph. D. Student||1||33%|
|Professor > Associate Professor||1||33%|
|Readers by discipline||Count||As %|