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Chapter title |
Reliability Simulation Models for Hot Carrier Degradation
|
---|---|
Chapter number | 16 |
Book title |
Hot Carrier Degradation in Semiconductor Devices
|
Published by |
Springer, Cham, January 2015
|
DOI | 10.1007/978-3-319-08994-2_16 |
Book ISBNs |
978-3-31-908993-5, 978-3-31-908994-2
|
Authors |
A. J. Scholten, B. De Vries, J. Bisschop, G. T. Sasse |