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Channel Hot Carriers in SiGe and Ge pMOSFETs
Hot Carrier Degradation in Semiconductor Devices
Springer, Cham, January 2015
Jacopo Franco, Ben Kaczer
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||2||100%|
|Readers by discipline||Count||As %|