You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Characterization and Modeling of High-Voltage LDMOS Transistors
Hot Carrier Degradation in Semiconductor Devices
Springer, Cham, January 2015
Susanna Reggiani, Gaetano Barone, Elena Gnani, Antonio Gnudi, Giorgio Baccarani, Stefano Poli, Rick Wise, Ming-Yeh Chuang, Weidong Tian, Sameer Pendharkar, Marie Denison
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Readers by discipline||Count||As %|