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Physics-Based Modeling of Hot-Carrier Degradation
Hot Carrier Degradation in Semiconductor Devices
Springer, Cham, January 2015
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Master||1||33%|
|Readers by discipline||Count||As %|