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Mendeley readers
Chapter title |
Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation
|
---|---|
Chapter number | 19 |
Book title |
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
|
Published by |
Springer, Berlin, Heidelberg, September 2007
|
DOI | 10.1007/978-3-540-74442-9_19 |
Book ISBNs |
978-3-54-074441-2, 978-3-54-074442-9
|
Authors |
CR. Parthasarathy, A. Bravaix, C. Guérin, M. Denais, V. Huard, Parthasarathy, CR., Bravaix, A., Guérin, C., Denais, M., Huard, V. |
Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 7 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 4 | 57% |
Other | 1 | 14% |
Student > Doctoral Student | 1 | 14% |
Unknown | 1 | 14% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 5 | 71% |
Materials Science | 1 | 14% |
Unknown | 1 | 14% |