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Scanning Probe Microscopy of Functional Materials

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Cover of 'Scanning Probe Microscopy of Functional Materials'

Table of Contents

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    Book Overview
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    Chapter 1 Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy
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    Chapter 2 High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy
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    Chapter 3 Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications
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    Chapter 4 Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods
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    Chapter 5 Multi-Frequency Atomic Force Microscopy
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    Chapter 6 Dynamic Nanomechanical Characterization Using Multiple-Frequency Method
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    Chapter 7 Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry
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    Chapter 8 Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties
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    Chapter 9 Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques
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    Chapter 10 Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
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    Chapter 11 High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth
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    Chapter 12 Polar Structures in Relaxors by Piezoresponse Force Microscopy
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    Chapter 13 Symmetries in Piezoresponse Force Microscopy
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    Chapter 14 New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy
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    Chapter 15 Scanning Ion Conductance Microscopy
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    Chapter 16 Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics
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    Chapter 17 Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy
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    Chapter 18 Polarization Behavior in Thin Film Ferroelectric Capacitors at the Nanoscale
Attention for Chapter 10: Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
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Chapter title
Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
Chapter number 10
Book title
Scanning Probe Microscopy of Functional Materials
Published by
Springer, New York, NY, January 2010
DOI 10.1007/978-1-4419-7167-8_10
Book ISBNs
978-1-4419-6567-7, 978-1-4419-7167-8
Authors

Lili Tian, Vasudeva Rao Aravind, Venkatraman Gopalan

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 6 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 3 50%
Student > Ph. D. Student 2 33%
Student > Master 1 17%
Readers by discipline Count As %
Materials Science 4 67%
Physics and Astronomy 1 17%
Engineering 1 17%