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Simulation and Verification of Tip-Induced Polarization During Kelvin Probe Force Microscopy Measurements on Film Capacitors
3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM)
ADS, January 2017
D. A. Nielsen, V. N. Popok, K. Pedersen
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Professor > Associate Professor||1||50%|
|Readers by discipline||Count||As %|
|Physics and Astronomy||1||50%|