You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
| Chapter title |
Test Modes
|
|---|---|
| Chapter number | 20 |
| Book title |
VLSI-Design of Non-Volatile Memories
|
| Published by |
Springer, Berlin, Heidelberg, January 2005
|
| DOI | 10.1007/3-540-26500-7_20 |
| Book ISBNs |
978-3-54-020198-4, 978-3-54-026500-9
|