System-on-Chip Test Scheduling with Reconfigurable Core Wrappers

Overview of attention for article published in IEEE Transactions on Very Large Scale Integration (VLSI) Systems, March 2006

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Test scheduling and test access in test compression environment

Grant US-10955460-B2

United States of America

Test scheduling with pattern-independent test access mechanism

Grant US-9088522-B2

United States of America

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