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Practice of Surface and Interface Analysis with AES and XPS
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Springer, Berlin, Heidelberg, January 2013
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||2||200%|
|Readers by discipline||Count||As %|