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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Overview of attention for book
Cover of 'Auger- and X-Ray Photoelectron Spectroscopy in Materials Science'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction and Outline
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    Chapter 2 Instrumentation
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    Chapter 3 Qualitative Analysis (Principle and Spectral Interpretation)
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    Chapter 4 Quantitative Analysis (Data Evaluation)
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    Chapter 5 Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness
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    Chapter 6 Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio
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    Chapter 7 Quantitative Compositional Depth Profiling
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    Chapter 8 Practice of Surface and Interface Analysis with AES and XPS
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    Chapter 9 Typical Applications of AES and XPS
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    Chapter 10 Surface Analysis Techniques Related to AES and XPS
Attention for Chapter 6: Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio
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