English
German
Rastersondenmikroskopie
Cited by user Bert Voigtlaender on
German
Rasterkraftmikroskop
Cited by user Bert Voigtlaender on
English
Atomic Force Microscopy
Overview of attention for book
Table of Contents
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Altmetric BadgeBook Overview
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Altmetric BadgeChapter 1 Introduction
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Altmetric BadgeChapter 2 Harmonic Oscillator
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Altmetric BadgeChapter 3 Technical Aspects of Atomic Force Microscopy
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Altmetric BadgeChapter 4 Atomic Force Microscopy Designs
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Altmetric BadgeChapter 5 Electronics and Control for Atomic Force Microscopy
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Altmetric BadgeChapter 6 Lock-in Technique
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Altmetric BadgeChapter 7 Data Representation and Image Processing
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Altmetric BadgeChapter 8 Artifacts in AFM
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Altmetric BadgeChapter 9 Work Function, Contact Potential, and Kelvin Probe AFM
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Altmetric BadgeChapter 10 Forces Between Tip and Sample
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Altmetric BadgeChapter 11 Cantilevers and Detection Methods in Atomic Force Microscopy
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Altmetric BadgeChapter 12 Static Atomic Force Microscopy
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Altmetric BadgeChapter 13 Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
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Altmetric BadgeChapter 14 Intermittent Contact Mode/Tapping Mode
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Altmetric BadgeChapter 15 Mapping of Mechanical Properties Using Force-Distance Curves
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Altmetric BadgeChapter 16 Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy—Non-contact Atomic Force Microscopy
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Altmetric BadgeChapter 17 Noise in Atomic Force Microscopy
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Altmetric BadgeChapter 18 Quartz Sensors in Atomic Force Microscopy