Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm

Overview of attention for article published in Journal of Applied Physics, June 2019

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RT @ASCENTeu: 🔔Semiconductor materials for #nanoelectronics and #cryogenic electronics 🔔 📖"Exploring conductivity in ex-situ doped Si thin…

05 Sep 2022

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🔔Semiconductor materials for #nanoelectronics and #cryogenic electronics 🔔 📖"Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm" @TyndallInstitut ➕our Transnational Access offer: https://t.co/XxxmSRQz0N https://t.co/Zh2a

05 Sep 2022

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Learn about the joint #QuantumATK-experimental study by @TyndallInstitut, @Applied4Tech and others, exploring conductivity in ex-situ doped Si thin films https://t.co/lihO0UA0lC #semiconductors #electronics https://t.co/UbFUxz344Q

12 Aug 2020

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Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm Journal of Applied Physics, Volume 125, Issue 22, June 2019. Silicon (Si) has been scaled below 10 nm in mul.. read more: https://t.co/BcDULtmnxD #QuantumComputing https

16 Jun 2019

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