↓ Skip to main content

Use of X-ray micro computed tomography imaging to analyze the morphology of wheat grain through its development

Overview of attention for article published in Plant Methods, July 2019
Altmetric Badge

About this Attention Score

  • Good Attention Score compared to outputs of the same age (66th percentile)
  • Above-average Attention Score compared to outputs of the same age and source (53rd percentile)

Mentioned by

twitter
6 X users
facebook
1 Facebook page

Citations

dimensions_citation
37 Dimensions

Readers on

mendeley
68 Mendeley